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Reflection Data Processing
Efficiently process reflection data in one application with multistep redo and undo
Reflector main screenshot
Data input
  • Import all records of a survey line at one time
  • Efficiently assign geometry with layout chart
  • CMP binning for crooked lines
Reflector screenshot 0.0
  • Field static correction, trigger delay correction, and divergence correction
  • AGC, trace balance, and time variant scaling
  • Frequency filtering, F-K filtering, and Tau-p mapping
  • Spiking deconvolution and predictive deconvolution
  • Random noise attenuation
  • Surgical, top, and bottom trace muting
  • Gather sorting (CMP, common shot, common receiver, or common offset)
  • Velocity analysis on CMP or common shot gathers
  • NMO correction and inverse NMO correction
  • Stacking
  • Residual static correction
  • Post-stack migration
  • Time-to-depth conversion
  • Semi-automatic horizon picking
  • Extraction of instantaneous amplitude, phase, frequency, and Q factor
  • Undo or redo multiple steps in data processing
Reflector screenshot 1.0
Reflector screenshot 1.1
Reflector screenshot 1.2
  • Print ultra-long section
  • Save section with customized image size
  • Export common offset gathers into SF IMAGER
Reflector screenshot 2.0