Reflector
Reflection Data Processing
Efficiently process reflection data in one application with multistep redo and undo
Data input
- Import all records of a survey line at one time
- Efficiently assign geometry with layout chart
- CMP binning for crooked lines
Processing
- Field static correction, trigger delay correction, and divergence correction
- AGC, trace balance, and time variant scaling
- Frequency filtering, F-K filtering, and Tau-p mapping
- Spiking deconvolution and predictive deconvolution
- Random noise attenuation
- Surgical, top, and bottom trace muting
- Gather sorting (CMP, common shot, common receiver, or common offset)
- Velocity analysis on CMP or common shot gathers
- NMO correction and inverse NMO correction
- Stacking
- Residual static correction
- Post-stack migration
- Time-to-depth conversion
- Semi-automatic horizon picking
- Extraction of instantaneous amplitude, phase, frequency, and Q factor
- Undo or redo multiple steps in data processing
Output
- Print ultra-long section
- Save section with customized image size
- Export common offset gathers into SF IMAGER
See other Reflection products:
